学术报告:Soft matter at and beyond the limits of soft x-ray microscopy

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报告题目:Soft matter at and beyond the limits of soft x-ray microscopy
 
报 告 人:Prof.Rainer H. Fink (FAU Erlangen-Nürnberg ) 
报告时间:4月7日上午10:30 
报告地点:张江园区科研楼303 

报告简介: 
  Zone-plate based soft x-ray microspectroscopy has developed into a routine technique to analysing all kind of materials. Specifically the investigation of molecule-based materials gains from the chemical fingerprint sensitivity of near-edge x-ray absorption fine structure. We will discuss various applications of the SLS PolLux-STXM to soft matter specimens, ranging from polymer materials, polymer blends, organic nanocrystals and organic electronic thin film devices. Since spatial resolution in state-of-the-art zone plate-based microscopy is limited, complementary techniques are required that offer chemical insight also beyond the present STXM resolution level. Therefore, soft x-ray resonant scattering has been employed to resolve structures in the sub-10 nm regime.   

报告人简历: 
Scientific training and professional experience 
1980 Graduation from High School (Abitur), Gymnasium Weikersheim 
1980 - 1982 Military Service 
1982 - 1988 Study of Physics, Univ. Konstanz 
1992 Ph.D. in Experimental Physics, Univ. Konstanz (Prof. G. Schatz) „PAC investigations on the atomic mobility on metal surfaces” (summa cum laude) 
1992-1993 PostDoc-position, Uppsala University (Prof. E. Karlsson), Sweden (nuclear probes for the investigation of magnetic surfaces and interfaces) 
1993-2002 Research assistant with Prof. E. Umbach (Univ. Würzburg), Germany 
1999 Habilitation in Experimental Physics, Univ. Würzburg (with Prof. Eberhard Umbach, now director KIT)”Geometric and electronic properties of organic thin films and organic-metal interfaces” 
since 2002 C3-Professor, Friedrich-Alexander Universität Erlangen-Nürnberg 
Research interests and experience 
Organic thin films, molecular self-organization, organic nanostructures, interface-controlled organic structures 
Organic thin film devices (OFETs), in-operando electron spectroscopies, polymer-based solar cells 
Organic hybrid materials / phase-change materials 
Surface and interface science, electron spectroscopies, high-resolution x-ray spectroscopy 
Spectromicroscopy, instrumentation development, aberration-corrected PEEM/LEEM 
Zone-plate based x-ray microscopy, instrumentation development (PolLux, NanoXAS) 
Selected publications 
A. Schöll, L. Kilian, Y. Zou, J. Ziroff, S. Hame, F. Reinert, E. Umbach, and R.H. Fink: "Disordering of an Organic Overlayer on a Metal Surface Upon Cooling", Science 329 (2010) 303. 
Th. Schmidt, H. Marchetto, P. Lévesque, U. Groh, F. Maier, D. Preikszas, P. Hartel, R. Spehr, G. Lilienkamp, R. Fink, E. Bauer, H. Rose, E. Umbach, H.-J. Freund: "Successful double aberration correction in a low-energy electron microscope", Ultramicroscopy 110 (2010) 1358 
J. Raabe, G. Tzvetkov, U. Flechsig, M. Böge, A. Jaggi, B. Sarafimov, M.G.C. Vernooij, T. Huthwelker, H. Ade, D. Kilcoyne, T. Tyliszczak, R.H. Fink, C. Quitmann : "PolLux: A new facility for Soft X-Ray Spectromicroscopy at the SLS", Rev. Sci. Instrum. 79 (2008) 11370 
Chr. Hub, M. Burkhardt, M. Halik, R.H. Fink: "In situ STXM investigations of pentacene-based OFETs during operation", J. Mat. Chem. 20 (2010) 4884  
B. A. Collins, J. Cochran, H. Yan, E. Gann, C. Hub, R. Fink, C. Wang, T. Schuettfort, C. R. McNeill, M. L. Chabinyc, and H. Ade: "Polarized x-ray scattering reveals non-crystalline orientational ordering in organic films", Nature Materials 11(6) (2012) 536 
N. Pilet, J. Raabe, St. Stevenson, S Romer, L. Bernard, Chr. R. McNeill, R. Fink, H. J. Hug, Chr. Quitmann: "Nanostructure characterization by a combined x-ray absorption / scanning force microscopy system", Nanotechnology 23(47) (2012) 475708
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