报告题目：Soft-x-ray spectromicroscopy (SPEM and STXM) at the Pohang Light Source
报 告 人：Hyun-Joon Shin, Pohang Accelerator Laboratory, Pohang University of Science and Technology, Pohang, Korea, email@example.com
After a brief introduction to Pohang Light Sources (PLSs) (3rd generation synchrotron light source and 4th generation x-ray free-electron laser), two kinds of soft x-ray based spectromicroscopy, scanning photoelectron microscopy (SPEM) and scanning transmission x-ray microscopy (STXM), at the PLS will be introduced.
As a very surface sensitive probe for chemical states and electronic structure, SPEM at the PLS has been actively applied for the investigation of 2-D materials with space-resolution of ~0.5 micrometer. SPEM application examples on graphene layers and other kinds of 2-D materials, such as MoS2 and WSe2 materials, will be presented. STXM is a nano x-ray spectroscopy (XAS). STXM at PLS has been operational from 2014 yr., typically with ~30 nm space resolution. Details on STXM performance and application activities will be presented, and then recent attempts to improve functionality, e.g. addition of soft x-ray fluorescence measurement and Ptychography measurement, will be addressed.
Prof. Hyun-Joon Shin
1990.3 - 1995.2: Ph. D. in Experimental Plasma Physics
Dept. of Physics, Pohang University of Science and Technology
1986.3 - 1988.2: M. S. in Optics , Dept. of Physics, Seoul National University
1982.3 - 1986.3: B. S. in Physics, Dept. of Physics, Seoul National University.
2001.4 - present: Adjunct Professor, POSTECH
1996.6 - present: Principal research scientist (2015 – present)/ Acting principal research scientist (2011-2015)/ Senior research scientist (1999-2011)/ Research Scientist (1996-1999), Pohang Accelerator Laboratory (PAL), POSTECH.
2016.3 – presents: Head of PLS-II beamline division, PAL, POSTECH
2006.12 – 2010.: Leader of ‘Soft x-ray operation team’, Beamline division,
2015.3 – 2016.2: Visiting Scholar, Elettra-sincrotrone Trieste, Trieste, Italy,
2005.11-2006.10: Visiting scholar, Advanced Light Source/
Lawrence Berkeley National Laboratory, USA
1995.3 - 1996.5: Postdoctoral fellow, Advanced Light Source/
Lawrence Berkeley National Laboratory, USA.
Korean Physical Society: 1990.12.20 - present
Korean Vacuum Society: 2000.07.13 - present
Korean Synchrotron Radiation Users Community: 1997.02.18 - present
Editorial board of Advertisement Magazine for Korean Physical Society: 2007.05 – 2010.04
Editorial board of Advertisement Magazine for Korean Synchrotron Radiation Users Community: chairman (2016.1 – present), member (2013.8-2015.12), member (2000.03 – 2004.02)
Program Committee Member: International Conference on X-ray Microscopy: 2004 – 2013 (4 times)
SpectroNanoscopy workshop: organizing chair 2013, 2014, 2015.
Fields of interest:
Scanning photo-electron microscopy (SPEM)
Scanning transmission x-ray microscopy (STXM)
Full field x-ray microscopy (TXM)
Application of spectroscopy and spectromicroscopy
TSO (Transparent semiconducting oxides): Ga-In-Zn-O system
PRAM (phase change random access memory): Ge-Sb-Te system
OLED (organic light emitting devices): Degradation mechanism
Characterization of nano materials and nano devices
Molecular nitrogen in solids
Effect and use of focused x-rays
Ultrafast (<1 ps) streak camera development for ultrafast dynamics study
Plasma spectroscopy (for temperature and density measurement)
Soft x-ray lasers (generation by capillary discharge)