学术报告:Soft-x-ray spectromicroscopy at the Pohang Light Source II

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报告题目:Soft-x-ray spectromicroscopy at the Pohang Light Source II

报 告 人:Hyun-Joon Shin, Pohang Accelerator Laboratory, Pohang, Korea,

报告时间:2017年11月20日上午10:30

报告地点:嘉定学术活动中心307会议室

报告摘要:

After a brief introduction to Pohang Light Sources (PLSs) (3rd generation synchrotron light source and 4th generation x-ray free-electron laser), two kinds of soft x-ray based spectromicroscopy, scanning photoelectron microscopy (SPEM) and scanning transmission x-ray microscopy (STXM), at the PLS will be introduced.

As a very surface sensitive probe for chemical states and electronic structure, SPEM at the PLS has been actively applied for the investigation of 2-D materials with space-resolution of ~0.5 micrometer. SPEM application examples on graphene layers and other kinds of 2-D materials, such as MoS2 and WSe2 materials, will be presented. STXM is a nano x-ray spectroscopy (XAS). STXM at PLS has been operational from 2014 yr., typically with ~30 nm space resolution. Details on STXM performance and application activities will be presented, and then recent attempts to improve functionality, e.g. addition of soft x-ray fluorescence measurement and Ptychography measurement, will be addressed.

Prof. Hyun-Joon Shin
 Education
 1990.3 - 1995.2: Ph. D. in Experimental Plasma Physics
 Dept. of Physics, Pohang University of Science and Technology
 1986.3 - 1988.2: M. S. in Optics , Dept. of Physics, Seoul National University
 1982.3 - 1986.3: B. S. in Physics, Dept. of Physics, Seoul National University.
 Positions held: 
 2001.4 - present: Adjunct Professor, POSTECH 
 1996.6 - present: Principal research scientist (2015 – present)/ Acting principal research scientist (2011-2015)/ Senior research scientist (1999-2011)/ Research Scientist (1996-1999), Pohang Accelerator Laboratory (PAL), POSTECH.
 2016.3 – presents: Head of PLS-II beamline division, PAL, POSTECH
 2006.12 – 2010.: Leader of ‘Soft x-ray operation team’, Beamline division, PAL, POSTECH. 
 2015.3 – 2016.2: Visiting Scholar, Elettra-sincrotrone Trieste, Trieste, Italy,
 2005.11-2006.10: Visiting scholar, Advanced Light Source/Lawrence Berkeley National Laboratory, USA
 1995.3 - 1996.5:  Postdoctoral fellow, Advanced Light Source/Lawrence Berkeley National Laboratory, USA.
 Membership/Association: 
 Korean Physical Society: 1990.12.20 - present
 Korean Vacuum Society: 2000.07.13 - present
 Korean Synchrotron Radiation Users Community: 1997.02.18 - present
 Editorial board of Advertisement Magazine for Korean Physical Society: 2007.05 – 2010.04
 Editorial board of Advertisement Magazine for Korean Synchrotron Radiation Users Community: chairman (2016.1 – present), member (2013.8-2015.12), member (2000.03 – 2004.02)
Program Committee Member: International Conference on X-ray Microscopy: 2004 – 2013 (4 times) 
SpectroNanoscopy workshop: organizing chair 2013, 2014, 2015.
 Fields of interest: 
 Submicrometer-scale spectromicroscopy 
 Scanning photo-electron microscopy (SPEM)
 Scanning transmission x-ray microscopy (STXM)
 Full field x-ray microscopy (TXM)
 Application of spectroscopy and spectromicroscopy
  TSO (Transparent semiconducting oxides): Ga-In-Zn-O system
  PRAM (phase change random access memory): Ge-Sb-Te system 
  OLED (organic light emitting devices): Degradation mechanism 
  Characterization of nano materials and nano devices
  Molecular nitrogen in solids
  Effect and use of focused x-rays
 Ultrafast (<1 ps) streak camera development for ultrafast dynamics study
 Plasma spectroscopy (for temperature and density measurement)
 Soft x-ray lasers (generation by capillary discharge)

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